Hantek Unveils HDL3000 Series Multi Channel Programmable DC Electronic Load. Built for multi channel power supply testing, it provides high integration test solutions for R&D, production line aging and quality inspection.
The HDL3000 series offers four channel and eight channel configurations with multiple models. Voltage ranges from 0 to 600 V and current ranges from 0 to 60 A. The device supports convenient rack mounting and saves cabinet space.
Integrated with practical functions including sequence test, OCP over current protection test, voltage ripple measurement and short circuit simulation test, the unit supports programmable current slew rate, high speed dynamic loading and programmable sequence functions, which fully meets various verification requirements of engineers during product R&D phase.
Basic Modes
Four basic modes including constant voltage, constant current, constant resistance and constant power are built in to meet a wide range of test requirements.
OCP / OPP Test
The instrument automatically captures OCP and OPP points and judges whether test results exceed the set specifications, saving users time on design verification and system validation.
Waveform Display and Recording
It can display and record the changing process of current, voltage, resistance and power values in various modes in real time, and generate dynamic curves for storage.
Voltage Ripple Measurement
It can accurately evaluate the dynamic response and stability of power supplies, quickly locate transient anomalies and excessive ripple issues, and improve the efficiency and reliability of power supply design and debugging.
Summary
This series covers a wide range of test fields. It is applicable to the R&D, production, aging and quality inspection of low power power supplies, DCDC modules, mobile phone chargers and UPS power supplies. It also supports test tasks such as battery PACK, BMS balanced discharge, power tool production test and LED power board inspection. One unit can perform synchronous testing for multiple devices under test, effectively improving multi channel test efficiency and reducing the setup cost of the complete test system.
